| Kelompok Keahlian | KK Rekayasa Kinerja Lingkungan Binaan |
|---|---|
| Sekolah/Fakultas | Fakultas Teknologi Industri |
| Jabatan Fungsional | – |
- S1
ITB, Bandung – Indonesia
2011
- S1
ITB, Bandung – Indonesia
2015
- S1
ITB, Bandung – Indonesia
2023
- Google Scholar
- h-index : 6
- i10-index : 6
- Scopus
- h-index : 6
- Sinta
- SINTA Score Overall : 256
- SINTA Score 3 Years : 174
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- Thermoelectric properties enhancement and optimization of SnTe-based material with single doping: RSM-ANN approach
FP Nasution, AR Muchtar, B Yuliarto, FXN Soelami, N NasruddinMaterials Chemistry and Physics 325, 129779 (2024)
- Shape-stabilized phase change materials: Performance of simple physical blending synthesis and the potential of coconut based materials
AR Muchtar, CL Hassam, B Srinivasan, D Berthebaud, T Mori, N Soelami, ...Journal of Energy Storage 52, 104974 (2022)
- Thermoelectric performance of Ge1-xSnxTe (0≤ x≤ 0.2) prepared by facile method
D Sidharth, AR Muchtar, ASA Nedunchezhian, M Arivanandhan, ...Journal of Solid State Chemistry 310, 122995 (2022)
- Feasibility of high performance in p‐type Ge1−xBixTe materials for thermoelectric modules
Z Dashevsky, I Horichok, M Maksymuk, AR Muchtar, B Srinivasan, T MoriJournal of the American Ceramic Society 105 (6), 4500-4511 (2022)
- Thermal conductivity of rare-earth titanate pyrochlores
M Tachibana, AR Muchtar, T MoriPhysical Review Materials 6 (4), 045405 (2022)
- Thermoelectric properties of Nb-doped Sr1− x (La0. 5Na0. 5) x TiO3 perovskites
M Tachibana, AR Muchtar, T MoriApplied Physics Express 15 (1), 011003 (2021)
- Physical Insights on the Lattice Softening Driven Mid‐Temperature Range Thermoelectrics of Ti/Zr‐Inserted SnTe—An Outlook Beyond the Horizons of Conventional Phonon Scattering …
AR Muchtar, B Srinivasan, SL Tonquesse, S Singh, N Soelami, B Yuliarto, ...Advanced Energy Materials 11 (28), 2101122 (2021)
- Preparation of graphene–zinc oxide nanostructure composite for carbon monoxide gas sensing
AR Muchtar, NLW Septiani, M Iqbal, A Nuruddin, B YuliartoJournal of Electronic Materials 47, 3647-3656 (2018)
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